[Igeba] Rv: Characterizing Materials Webinar: Breakthroughs in
analysis at the nano-scale.
Maria Elena Rodriguez Areal
mrodriguezareal en yahoo.com.ar
Jue Feb 25 11:45:06 ART 2016
Enviado desde Yahoo Mail con Android
El jue. 25 25e feb. 25e 2016 a las 9:45, Carlos G. Peralta<cgperalta en nanosystems.com.ar> escribi贸:
Estimados miembros de la comunidad cient铆fica argentina,
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Previendo que alguno de ustedes no haya recibido la invitaci贸n en forma directa, quer铆a reenviarles la invitaci贸n a participar de un Webinar organizado en forma conjunta por Oxford Instruments y ZEISS, a realizarse el pr贸ximo 11 de marzo.
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El mismo estar谩 enfocado en la observaci贸n, an谩lisis y caracterizaci贸n de materiales a escala nano utilizando SEM en bajo voltaje junto con EDS. 聽Particularmente se presentar谩n aplicaciones con el detector X-Max Extreme, capaz de analizar rayos x con energ铆as tan bajas que incluso permite detectar e incluso mapear la Litio.
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Espero puedan participar del webinar y obtener informaci贸n de relevancia para su actividad. 聽Por favor compartan esta invitaci贸n con los colegas que crean puedan estar interesados.
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http://emails.oxford-instruments.com/t/ViewEmail/r/EA990C84B2F70CF72540EF23F30FEDED/4FFDF53B39FA11BD7F4E5A579FEBB2E9
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Un cordial saludo,
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Carlos G. Peralta
Especialista en Microscop铆a Electr贸nica
Nano Systems Argentina
Distribuidor autorizado de Carl Zeiss Microscopy
TE: +54 351 644-5204
CEL: +54 9 351 686-1210
cgperalta en nanosystems.com.ar
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Webinar: Friday March 11th 2016
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Recent breakthroughs in low voltage SEM imaging and EDS analysis at the nano-scale
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This free webinar, jointly presented by ZEISS and Oxford Instruments, is a must for materials scientists and engineers needing to image and characterize regions less than 50 nm size in the scanning electron microscope.
ZEISS GeminiSEM 500, a new field emission SEM (FE-SEM) for sub-nanometer, low voltage images from any sample, offers exciting new capabilities for investigating smaller nano-structures, interfaces and surfaces. The Inlens EsB detector provides high resolution compositional contrast at typical 1-3 keV accelerating voltage. However, no traditional EDS detector聽could support elemental characterization at such low accelerating voltages. The new X-Max Extreme from Oxford Instruments changes this. With X-Max Extreme, both SEM imaging and EDS performance can be performed simultaneously and the EDS resolution approaches that of the SEM.
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After the webinar you will understand:
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鈼徛 How low voltage and short working distances provide a SEM based / bulk sample solution to nano-characterization
鈼徛 How the challenges of working at sub 3 kV accelerating voltage can now be overcome
鈼徛 How to correlate the compositional contrast obtained in a ZEISS FE-SEM with EDS results for the characterization of nano-structures and surfaces
The seamless integration of the X-Max Extreme detector from Oxford Instruments and ZEISS Gemini SEM 500 provides the breakthrough in fast and comprehensive imaging and material analysis at the nano-scale.
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Register for Morning in Europe (8AM GMT, 9AM CET)
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Register for Morning in USA (11AM EST)
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After registering, you will receive an聽email containing information about joining the webinar.
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Oxford Instruments on Twitter
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Oxford Instruments NanoAnalysis, Halifax Road, High Wycombe, HP12 3SE, United Kingdom.
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