[Igeba] Rv: Discover the Future of X-ray Microscopy with ZEISS VersaXRM 730
Maria Elena Rodriguez Areal
mrodriguezareal en yahoo.com.ar
Lun Ago 26 14:47:11 -03 2024
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----- Mensaje reenviado ----- De: "ZEISS Microscopy" <communications en microscopy.zeiss.com> Para: "mrodriguezareal en yahoo.com.ar" <mrodriguezareal en yahoo.com.ar> Cc: Enviado: lun, 26 de ago de 2024 a la(s) 11:15 Asunto: Discover the Future of X-ray Microscopy with ZEISS VersaXRM 730
Carl Zeiss AGExperience unparalleled resolution, throughput, and accessibility.
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| Dear Maria Elena Rodriguez Areal,
Researchers today are under increasing pressure to keep pace with demands for innovation, making it imperative to stay current with the technological advancements that provide solutions to their challenges.
Today, we introduce ZEISS VersaXRM 730, the most advanced X-ray microscope available, designed to flexibly address your dynamic needs, increase your return on investment, and provide greater accessibility to a wider array of users. |
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| Discover VersaXRM 730 |
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| ZEISS VersaXRM 730
More Than the Sum of Its Parts |
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| VersaXRM 730 offers a wider array of choices than any advanced XRM on the market, providing perfect tomographies for every user, every sample, every time.
This system is a game-changer for researchers who demand flexibility, precision, and efficiency in their imaging solutions.
- Breakthrough Resolution Performance: Achieve superior spatial resolution with the 40× Prime (40×-P) objective, delivering unparalleled performance across the full range of source voltage.
- Enhanced Productivity: Intuitive user interfaces with streamlined workflows reduce the learning curve for a broader set of users, accelerating productivity with faster throughput and faster time-to-results.
- Unprecedented Flexibility: Adaptable to a diverse set of samples and a wider range of user skill levels, expanding the horizons of your lab’s research possibilities.
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| Learn More |
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| Improve Productivity and Accessibility with Award-winning Human-Centered Design
Enhance Your Workflow With Integrated Intelligence |
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| ZEISS XRM researchers studied users in real time to understand their habits, biases, challenges, and workflows, resulting in an automated, sample-tailored guidance and control system. Combining with our advanced reconstruction capability makes every user successful.
- ZEN navx Guidance and Control System: Even the newest user can be immediately productive with effortless data acquisition and streamlined workflows, greatly reducing the burden of training. Your most experienced users can unlock the system and explore the full versatility of VersaXRM 730.
- ZEISS DeepRecon Pro: The Advanced Reconstruction Toolbox (ART) module takes every user’s results from good to great, improving image quality or increasing throughput.
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| Learn More |
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| Optimize Your Visibility
Not Just Resolution. Resolution Performance.
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| Resolution performance is about more than just the highest specified resolution. It is usable resolution, where it counts, for the widest range of sample types. See more features than ever possible.
- 40x-Prime Objective: Push the limits of submicron imaging with 450 nm spatial resolution, and 500 nm resolution across the full range of source voltage, from 30 kV to 160 kV.
- Integrated Intelligence: Gain deeper insights from your measurements with practical AI capabilities to improve image quality, expand your field of view, and extend your results.
40×-P resolution target image clearly showing 450 nm (and better) lines and spaces. |
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| Learn More |
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| Achieve Efficient, Fast Targeting of Your Sample
One-Minute Tomographies |
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| With VersaXRM 730, you can now navigate in 3D, image in 3D, and analyze in 3D with an innovative and immersive end-to-end 3D experience.
- FAST Mode: Achieve rapid turnaround on imaging or sample inspection with sub-one-minute tomographies using FAST Mode, enabled by the ZEISS Flat Panel Extension (FPX). Acquire more data with less system time.
- Volume Scout: Get to the right data the first-time using Volume Scout on the intuitive ZEN navx interface, pinpointing characteristics with confidence for true 3D feature targeting.
One-minute FAST Mode 3D image acquisition of MEMS gyroscope. |
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| Learn More |
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| Experience the Future of X-ray Microscopy
Join Our Webinars |
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| You are invited to two exclusive webinars where you will see the capabilities of VersaXRM 730. |
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| Achieve Efficient, Fast Targeting of Your Sample
One-Minute Tomographies |
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| Learn More About This Webinar → |
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| Efficient, Fast Targeting of Your Exploring Batteries & Energy Materials with Advanced X-ray Microscopy
Enhancing Safety, Performance, and Sustainability
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| Learn More About This Webinar → |
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| ZEISS VersaXRM 730 introduces a new era of flexibility to X-ray microscopy, with a highly accessible system that is designed to elevate your research with unmatched resolution, fast image acquisition, and versatility. All designed and built on the hallmark of ZEISS quality.
To learn more or to get in touch for further details, visit our website or contact us.
Kind Regards,
ZEISS Microscopy
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| You can find more information on:
ZEISS Website →
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| Carl Zeiss Microscopy GmbH
Carl-Zeiss-Promenade 10, 07745 Jena, Germany
Phone +49 7364 20-0 | microscopy en zeiss.com
Commercial register: Jena, HRB 210536
VAT ID No. DE814503774
WEEE Reg. No. DE 55298748
Dr. Michael Albiez (President & CEO), Sandro Förster
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